Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9767986 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang +1 more | 2017-09-19 |
| 9748294 | Anti-reflection layer for back-illuminated sensor | Masaharu Muramatsu, Hisanori Suzuki, Yasuhito Yoneta, Shinya Otsuka, Jehn-Huar Chem +3 more | 2017-08-29 |
| 9733640 | Method and apparatus for database-assisted requalification reticle inspection | Lih-Huah Yiin, Rui-fang Shi | 2017-08-15 |