Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9805462 | Machine learning method and apparatus for inspecting reticles | Abdurrahman Sezginer, Gang Pan | 2017-10-31 |
| 9652843 | Machine learning method and apparatus for inspecting reticles | Abdurrahman Sezginer, Gang Pan | 2017-05-16 |
| 9607371 | Mesoscopic defect detection for reticle inspection | Rui-fang Shi, Zhian Guo | 2017-03-28 |