Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9805462 | Machine learning method and apparatus for inspecting reticles | Gang Pan, Bing Li | 2017-10-31 |
| 9766185 | Block-to-block reticle inspection | Patrick LoPresti, Joe Blecher, Rui-fang Shi, Yalin Xiong, John Fielden | 2017-09-19 |
| 9652843 | Machine learning method and apparatus for inspecting reticles | Gang Pan, Bing Li | 2017-05-16 |
| 9547892 | Apparatus and methods for predicting wafer-level defect printability | Rui-fang Shi | 2017-01-17 |