Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9805462 | Machine learning method and apparatus for inspecting reticles | Abdurrahman Sezginer, Bing Li | 2017-10-31 |
| 9747518 | Automatic calibration sample selection for die-to-database photomask inspection | Feng Zhao | 2017-08-29 |
| 9652843 | Machine learning method and apparatus for inspecting reticles | Abdurrahman Sezginer, Bing Li | 2017-05-16 |