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FinFET for device characterization |
Chang-Yun Chang, Cheng-Chuan Huang, Fu-Liang Yang |
2016-09-27 |
| 9453877 |
Testing holders for chip unit and die package |
Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin |
2016-09-27 |
| 9448285 |
Method and apparatus of wafer testing |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Shang-Ju Lee |
2016-09-20 |
| 9417285 |
Integrated fan-out package-on-package testing |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin |
2016-08-16 |
| 9372227 |
Integrated circuit test system and method |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Wei-Hsun Lin, Chung-Han Huang |
2016-06-21 |
| 9341671 |
Testing holders for chip unit and die package |
Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin |
2016-05-17 |
| 9310437 |
Adaptive test sequence for testing integrated circuits |
Chun-Cheng Chen, Hung-Chih Lin, Mill-Jer Wang, Ching-Nen Peng |
2016-04-12 |
| 9258618 |
Channelization method of digital content and audio-video server system |
Chung-Chi Chang, I-Cheng He, Kuang-Min Hsu |
2016-02-09 |
| 9252593 |
Three dimensional integrated circuit electrostatic discharge protection and prevention test interface |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin |
2016-02-02 |
| 9234940 |
Integrated fan-out wafer architecture and test method |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin |
2016-01-12 |
