Hao Chen — 10 Patents at Innolux

Issued Patents 2016

Showing 1–10 of 10 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
9455348	FinFET for device characterization	Chang-Yun Chang, Cheng-Chuan Huang, Fu-Liang Yang	2016-09-27	$6,028,000
9453877	Testing holders for chip unit and die package	Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin	2016-09-27	$6,028,000
9448285	Method and apparatus of wafer testing	Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Shang-Ju Lee	2016-09-20	$2,159,000
9417285	Integrated fan-out package-on-package testing	Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin	2016-08-16	$2,289,000
9372227	Integrated circuit test system and method	Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Wei-Hsun Lin, Chung-Han Huang	2016-06-21	$3,042,000
9341671	Testing holders for chip unit and die package	Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin	2016-05-17	$2,769,000
9310437	Adaptive test sequence for testing integrated circuits	Chun-Cheng Chen, Hung-Chih Lin, Mill-Jer Wang, Ching-Nen Peng	2016-04-12	$3,173,000
9258618	Channelization method of digital content and audio-video server system	Chung-Chi Chang, I-Cheng He, Kuang-Min Hsu	2016-02-09
9252593	Three dimensional integrated circuit electrostatic discharge protection and prevention test interface	Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin	2016-02-02	$4,074,000
9234940	Integrated fan-out wafer architecture and test method	Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin	2016-01-12	$4,247,000