Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9448285 | Method and apparatus of wafer testing | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2016-09-20 |
SL
Shang-Ju Lee
Overall (2016): #229,962 of 481,213Top 50%
1
Patents 2016