Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9494562 | Method and apparatus for defect detection in composite structures | Lay Siong Goh, Lye Seng Wong, Heng Kiat Jonathan Hey, Ricky Riyadi Chan, Roman Britner | 2016-11-15 |
| 9372227 | Integrated circuit test system and method | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen, Chung-Han Huang | 2016-06-21 |
| 9354254 | Test-yield improvement devices for high-density probing techniques and method of implementing the same | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, De-Jian Liu | 2016-05-31 |