| 9448184 |
Method and system for determining one or more optical characteristics of structure of a semiconductor wafer |
Yung-Ho Alex Chuang, John Fielden |
2016-09-20 |
| 9448162 |
Time-resolved single-photon or ultra-weak light multi-dimensional imaging spectrum system and method |
Guangjie Zhai, Wenkai Yu, Xuri Yao, Chao Wang, Zhibin Sun |
2016-09-20 |
| 9404960 |
On chip bias temperature instability characterization of a semiconductor device |
Hanyi Ding, Alvin W. Strong, Randy L. Wolf |
2016-08-02 |
| 9310296 |
Optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology |
Thaddeus Gerard Dziura, Yung-Ho Alex Chuang, Bin-Ming Benjamin Tsai, John J. Hench |
2016-04-12 |
| 9304335 |
Integrated LDMOS devices for silicon photonics |
John J. Ellis-Monaghan, William M. Green, Michael J. Hauser, Edward W. Kiewra, Steven M. Shank |
2016-04-05 |
| 9291554 |
Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspection |
Alexander Kuznetsov, Kevin Peterlinz, Andrei V. Shchegrov, Leonid Poslavsky |
2016-03-22 |
| 9279106 |
Immortalization of epithelial cells and methods of use |
Richard Schlegel |
2016-03-08 |
