Issued Patents 2016
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9448184 | Method and system for determining one or more optical characteristics of structure of a semiconductor wafer | Yung-Ho Alex Chuang, John Fielden | 2016-09-20 |
| 9448162 | Time-resolved single-photon or ultra-weak light multi-dimensional imaging spectrum system and method | Guangjie Zhai, Wenkai Yu, Xuri Yao, Chao Wang, Zhibin Sun | 2016-09-20 |
| 9404960 | On chip bias temperature instability characterization of a semiconductor device | Hanyi Ding, Alvin W. Strong, Randy L. Wolf | 2016-08-02 |
| 9310296 | Optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology | Thaddeus Gerard Dziura, Yung-Ho Alex Chuang, Bin-Ming Benjamin Tsai, John J. Hench | 2016-04-12 |
| 9304335 | Integrated LDMOS devices for silicon photonics | John J. Ellis-Monaghan, William M. Green, Michael J. Hauser, Edward W. Kiewra, Steven M. Shank | 2016-04-05 |
| 9291554 | Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspection | Alexander Kuznetsov, Kevin Peterlinz, Andrei V. Shchegrov, Leonid Poslavsky | 2016-03-22 |
| 9279106 | Immortalization of epithelial cells and methods of use | Richard Schlegel | 2016-03-08 |