Issued Patents 2011
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8067809 | Semiconductor storage device including a gate insulating film with a favorable nitrogen concentration profile and method for manufacturing the same | Junichi Kitagawa, Shigenori Ozaki, Tadahiro Ohmi | 2011-11-29 |
| 8030182 | Semiconductor device manufacturing method and semiconductor manufacturing apparatus | Tadahiro Ohmi, Hiroshi Akahori | 2011-10-04 |
| 7994063 | Method for manufacturing semiconductor device and method for cleaning semiconductor substrate | Tadahiro Ohmi, Rui Hasebe, Masayuki Miyashita | 2011-08-09 |
| 7975901 | Bonding apparatus and wire bonding method | Toru Maeda, Tetsuya Utano | 2011-07-12 |
| 7968470 | Plasma nitriding method, method for manufacturing semiconductor device and plasma processing apparatus | Tadahiro Ohmi, Minoru Honda, Toshio Nakanishi | 2011-06-28 |
| 7965097 | Test circuit, wafer, measuring apparatus, measuring method, device manufacturing method and display apparatus | Shigetoshi Sugawa | 2011-06-21 |
| 7960937 | Inverter unit, integrated circuit chip, and vehicle drive apparatus | Hitoshi Sumida, Ken Nonaka, Toshio Naka | 2011-06-14 |
| 7928518 | P-channel power MIS field effect transistor and switching circuit | Tadahiro Ohmi, Hiroshi Akahori, Keiichi Nii, Takanori Watanabe | 2011-04-19 |
| 7928018 | Plasma processing method and method for manufacturing an electronic device | Tadahiro Ohmi, Hiroshi Yamauchi, Yukio Hayakawa | 2011-04-19 |
| 7902595 | Power IC device and method of manufacturing same | Alberto O. Adan, Mitsuhiro Kikuta, Tadahiro Ohmi, Hiroo Yabe, Takanori Watanabe | 2011-03-08 |
| 7898033 | Semiconductor device | Tadahiro Ohmi | 2011-03-01 |
| 7893537 | Semiconductor device | Tadahiro Ohmi | 2011-02-22 |
| 7887385 | Organic EL light emitting element, manufacturing method thereof, and display device | Tadahiro Ohmi, Akihiro Morimoto | 2011-02-15 |
| 7863713 | Semiconductor device | Tadahiro Ohmi, Kazufumi Watanabe | 2011-01-04 |
| 7863925 | Test circuit, wafer, measuring apparatus, and measuring method | Shigetoshi Sugawa | 2011-01-04 |