Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6884641 | Site-specific methodology for localization and analyzing junction defects in mosfet devices | Terence L. Kane, Michael P. Tenney, Yun-Yu Wang | 2005-04-26 |
| 6878624 | Pre-anneal of CoSi, to prevent formation of amorphous layer between Ti-O-N and CoSi | Cyril Cabral, Jr., Christian Lavoie, Tina Wagner, Yun-Yu Wang, Horati S. Wildman +1 more | 2005-04-12 |
| 6875982 | Electron microscope magnification standard providing precise calibration in the magnification range 5000X-2000,000X | Stephen W. Bedell, Anthony G. Domenicucci, Devendra K. Sadana | 2005-04-05 |