Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946373 | Relaxed, low-defect SGOI for strained Si CMOS applications | Paul D. Agnello, Stephen W. Bedell, Robert H. Dennard, Keith E. Fogel, Devendra K. Sadana | 2005-09-20 |
| 6875982 | Electron microscope magnification standard providing precise calibration in the magnification range 5000X-2000,000X | Stephen W. Bedell, John Bruley, Devendra K. Sadana | 2005-04-05 |