Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6940069 | Pattern inspection method and apparatus using electron beam | Takashi Hiroi, Asahiro Kuni, Masahiro Watanabe, Chie Shishido, Hiroyuki Shinada +1 more | 2005-09-06 |
| 6903212 | Method for reducing an organic solvent remaining in β-form tris- (2,3,-epoxypropyl)—isocyanurate crystals | Hisao Ikeda, Motohiko Hidaka | 2005-06-07 |