Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6970004 | Apparatus for inspecting defects of devices and method of inspecting defects | Tohru Ishitani, Hidemi Koike, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2005-11-29 |
| 6960765 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Tohru Ishitani, Yuichi Hamamura +2 more | 2005-11-01 |
| 6944325 | Inspecting method and apparatus for repeated micro-miniature patterns | Junichi Taguchi, Masami Ikoto, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke | 2005-09-13 |
| 6895346 | Method for test conditions | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2005-05-17 |
| 6841405 | Photomask for test wafers | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2005-01-11 |