Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6895346 | Method for test conditions | Yuichi Hamamura, Hisao Asakura, Kazuyuki Tsunokuni, Aritoshi Sugimoto | 2005-05-17 |
| 6841405 | Photomask for test wafers | Yuichi Hamamura, Hisao Asakura, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2005-01-11 |