Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6970004 | Apparatus for inspecting defects of devices and method of inspecting defects | Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2005-11-29 |
| 6960765 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2005-11-01 |
| 6839200 | Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write element | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2005-01-04 |