Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6949744 | Electron microscopy system, electron microscopy method and focusing system for charged particles | Erik Essers | 2005-09-27 |
| 6903337 | Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same | Oliver Kienzle, Dirk Stenkamp, Rainer Knippelmeyer, Max Haider, Heiko Müller +1 more | 2005-06-07 |
| 6855938 | Objective lens for an electron microscopy system and electron microscopy system | Dirk Preikszas, Peter Hoffrogge, Peter Gnauck | 2005-02-15 |