Issued Patents 2005
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6929963 | Semiconductor component and method of manufacture and monitoring | — | 2005-08-16 |
| 6909293 | Space-saving test structures having improved capabilities | — | 2005-06-21 |
| 6897476 | Test structure for determining electromigration and interlayer dielectric failure | Seung-Hyun Rhee, Christine Hau-Riege, Amit P. Marathe | 2005-05-24 |
| 6873932 | Method and apparatus for predicting semiconductor device lifetime | — | 2005-03-29 |
| 6861696 | Structure and method for a two-bit memory cell | Nian Yang, Munseork Choi | 2005-03-01 |
| 6856160 | Maximum VCC calculation method for hot carrier qualification | Amit P. Marathe, Nian Yang, Tien-Chun Yang | 2005-02-15 |