Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6897476 | Test structure for determining electromigration and interlayer dielectric failure | Hyeon-Seag Kim, Christine Hau-Riege, Amit P. Marathe | 2005-05-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6897476 | Test structure for determining electromigration and interlayer dielectric failure | Hyeon-Seag Kim, Christine Hau-Riege, Amit P. Marathe | 2005-05-24 |