Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6944057 | Method to obtain temperature independent program threshold voltage distribution using temperature dependent voltage reference | Edward Franklin Runnion, Binh Quang Le, Shigekazu Yamada, Darlene Hamilton, Ming-Huei Shieh +2 more | 2005-09-13 |
| 6884638 | METHOD OF FABRICATING A FLASH MEMORY SEMICONDUCTOR DEVICE BY DETERMINING THE ACTIVE REGION WIDTH BETWEEN SHALLOW TRENCH ISOLATION STRUCTURES USING AN OVERDRIVE CURRENT MEASUREMENT TECHNIQUE AND A DEVICE THEREBY FABRICATED | Nian Yang, Zhigang Wang | 2005-04-26 |
| 6859393 | Ground structure for page read and page write for flash memory | Shigekazu Yamada, Ming-Huei Shieh, Pau-Ling Chen | 2005-02-22 |
| 6859748 | Test structure for measuring effect of trench isolation on oxide in a memory device | Nian Yang, Zhigang Wang | 2005-02-22 |
| 6856160 | Maximum VCC calculation method for hot carrier qualification | Hyeon-Seag Kim, Amit P. Marathe, Nian Yang | 2005-02-15 |