Issued Patents 2005
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6963506 | Circuit and technique for accurately sensing low voltage flash memory devices | Zhigang Wang, Yue-Song He | 2005-11-08 |
| 6898124 | Efficient and accurate sensing circuit and technique for low voltage flash memory devices | Zhigang Wang, Yue-Song He | 2005-05-24 |
| 6888157 | N-Gate/N-Substrate or P-Gate/P-Substrate capacitor to characterize polysilicon gate depletion evaluation | Zhigang Wang, Yue-Song He | 2005-05-03 |
| 6884638 | METHOD OF FABRICATING A FLASH MEMORY SEMICONDUCTOR DEVICE BY DETERMINING THE ACTIVE REGION WIDTH BETWEEN SHALLOW TRENCH ISOLATION STRUCTURES USING AN OVERDRIVE CURRENT MEASUREMENT TECHNIQUE AND A DEVICE THEREBY FABRICATED | Tien-Chun Yang, Zhigang Wang | 2005-04-26 |
| 6864106 | Method and system for detecting tunnel oxide encroachment on a memory device | Zhigang Wang, Xin Guo | 2005-03-08 |
| 6861696 | Structure and method for a two-bit memory cell | Hyeon-Seag Kim, Munseork Choi | 2005-03-01 |
| 6859748 | Test structure for measuring effect of trench isolation on oxide in a memory device | Zhigang Wang, Tien-Chun Yang | 2005-02-22 |
| 6856160 | Maximum VCC calculation method for hot carrier qualification | Hyeon-Seag Kim, Amit P. Marathe, Tien-Chun Yang | 2005-02-15 |