Issued Patents 2004
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6805390 | Nanotweezers and nanomanipulator | Yoshikazu Nakayama, Seiji Akita, Akio Harada | 2004-10-19 |
| 6802549 | Nanotweezers and nanomanipulator | Yoshikazu Nakayama, Seiji Akita, Akio Harada | 2004-10-12 |
| 6787769 | Conductive probe for scanning microscope and machining method using the same | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Yuichi Takano, Masatoshi Yasutake +1 more | 2004-09-07 |
| 6759653 | Probe for scanning microscope produced by focused ion beam machining | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Yuichi Takano, Masatoshi Yasutake +1 more | 2004-07-06 |
| 6731384 | Apparatus for detecting foreign particle and defect and the same method | Yoshimasa Ohshima, Minori Noguchi, Hidetoshi Nishiyama, Kenji Mitomo, Akira Hamamatsu +1 more | 2004-05-04 |
| 6705154 | Cantilever for vertical scanning microscope and probe for vertical scan microscope | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Yuichi Takano, Masatoshi Yasutake +1 more | 2004-03-16 |