Issued Patents 2004
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6826382 | Heat plate, heating element, belt type fixing device and image forming apparatus | Koichi Sanpei, Mitsuhiro Mori, Akio Yano, Masatoshi Kimura, Masao Konishi +6 more | 2004-11-30 |
| 6805390 | Nanotweezers and nanomanipulator | Yoshikazu Nakayama, Seiji Akita, Takashi Okawa | 2004-10-19 |
| 6802549 | Nanotweezers and nanomanipulator | Yoshikazu Nakayama, Seiji Akita, Takashi Okawa | 2004-10-12 |
| 6800865 | Coated nanotube surface signal probe and method of attaching nanotube to probe holder | Yoshikazu Nakayama, Seiji Akita | 2004-10-05 |
| 6787769 | Conductive probe for scanning microscope and machining method using the same | Yoshikazu Nakayama, Seiji Akita, Takashi Okawa, Yuichi Takano, Masatoshi Yasutake +1 more | 2004-09-07 |
| 6777637 | Sharpening method of nanotubes | Yoshikazu Nakayama, Seiji Akita | 2004-08-17 |
| 6777693 | Lithographic method using ultra-fine probe needle | Yoshikazu Nakayama | 2004-08-17 |
| 6764846 | Biojelly-producing microorganism, microorganism-containing coating, microorganism-containing coating film | Naoki Yamamori, Nobuki Hayase | 2004-07-20 |
| 6759653 | Probe for scanning microscope produced by focused ion beam machining | Yoshikazu Nakayama, Seiji Akita, Takashi Okawa, Yuichi Takano, Masatoshi Yasutake +1 more | 2004-07-06 |
| 6735046 | Nano-magnetic head and nano-magnetic head device using the same | Yoshikazu Nakayama | 2004-05-11 |
| 6719602 | Nanotube length control method | Yoshikazu Nakayama, Seiji Akita | 2004-04-13 |
| 6705154 | Cantilever for vertical scanning microscope and probe for vertical scan microscope | Yoshikazu Nakayama, Seiji Akita, Takashi Okawa, Yuichi Takano, Masatoshi Yasutake +1 more | 2004-03-16 |
| 6703615 | Light receiving and emitting probe and light receiving and emitting probe apparatus | Yoshikazu Nakayama | 2004-03-09 |