Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6817231 | Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof | Hiroyuki Akinaga, Hiroshi Yokoyama | 2004-11-16 |
| 6787769 | Conductive probe for scanning microscope and machining method using the same | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Takashi Okawa, Yuichi Takano +1 more | 2004-09-07 |
| 6759653 | Probe for scanning microscope produced by focused ion beam machining | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Takashi Okawa, Yuichi Takano +1 more | 2004-07-06 |
| 6705154 | Cantilever for vertical scanning microscope and probe for vertical scan microscope | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Takashi Okawa, Yuichi Takano +1 more | 2004-03-16 |