Issued Patents 2004
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6831451 | Method for adjusting a Weibull slope for variations in temperature and bias voltage | Jongwook Kye | 2004-12-14 |
| 6825684 | Hot carrier oxide qualification method | Amit P. Marathe, Nian Yang, Tien-Chun Yang | 2004-11-30 |
| 6812514 | High density floating gate flash memory and fabrication processes therefor | Nian Yang, Zhigang Wang | 2004-11-02 |
| 6806696 | Method for determining a Weibull slope having a bias voltage variation adjustment | — | 2004-10-19 |
| 6784682 | Method of detecting shallow trench isolation corner thinning by electrical trapping | Tien-Chun Yang, Nian Yang | 2004-08-31 |
| 6784061 | Process to improve the Vss line formation for high density flash memory and related structure associated therewith | Nian Yang, John Jianshi Wang | 2004-08-31 |
| 6762463 | MOSFET with SiGe source/drain regions and epitaxial gate dielectric | — | 2004-07-13 |
| 6737876 | Method and system for determining an operating voltage using a source/drain to gate overlap induced scaling factor | — | 2004-05-18 |
| 6734028 | Method of detecting shallow trench isolation corner thinning by electrical stress | Tien-Chun Yang, Nian Yang | 2004-05-11 |
| 6693009 | Flash memory cell with minimized floating gate to drain/source overlap for minimizing charge leakage | Unsoon Kim, Munseork Choi | 2004-02-17 |