Issued Patents 2004
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6825083 | Method for reducing shallow trench isolation edge thinning on thin gate oxides to improve peripheral transistor reliability and performance for high performance flash memory devices | Nian Yang, Xin Guo, Tien-Chun Yang | 2004-11-30 |
| 6797650 | Flash memory devices with oxynitride dielectric as the charge storage media | Zhigang Wang, Nian Yang, Jiang Li | 2004-09-28 |
| 6784061 | Process to improve the Vss line formation for high density flash memory and related structure associated therewith | Nian Yang, Hyeon-Seag Kim | 2004-08-31 |
| 6777957 | Test structure to measure interlayer dielectric effects and breakdown and detect metal defects in flash memories | Nian Yang, Zhigang Wang | 2004-08-17 |
| 6764920 | Method for reducing shallow trench isolation edge thinning on tunnel oxides using partial nitride strip and small bird's beak formation for high performance flash memory devices | Nian Yang, Unsoon Kim | 2004-07-20 |
| 6734080 | Semiconductor isolation material deposition system and method | Nian Yang, Tien-Chun Yang | 2004-05-11 |
| 6717850 | Efficient method to detect process induced defects in the gate stack of flash memory devices | Jiang Li, Nian Yang, Zhigang Wang | 2004-04-06 |