Issued Patents 2003
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6667476 | Scanning electron microscope | Shou Takami, Makoto Ezumi, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2003-12-23 |
| 6665141 | Magnetic head having track width defined by trench portions filled with magnetic shield material | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2003-12-16 |
| 6653633 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Fumio Mizuno, Shoji Yoshida, Mitsuji Ikeda +2 more | 2003-11-25 |
| 6646262 | Scanning electron microscope | Makoto Ezumi, Yoichi Ose, Naomasa Suzuki | 2003-11-11 |
| 6635873 | Scanning electron microscope with voltage applied to the sample | Makoto Ezumi, Yasutsugu Usami | 2003-10-21 |
| 6555819 | Scanning electron microscope | Naomasa Suzuki, Toshiro Kubo, Noriaki Arai, Mitsugu Sato, Yoichi Ose | 2003-04-29 |
| 6538844 | Method of fabricating a magnetic head by focused ion beam etching | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2003-03-25 |
| 6538249 | Image-formation apparatus using charged particle beams under various focus conditions | Atsushi Takane, Haruo Yoda, Fumio Mizuno, Shoji Yoshida, Mitsuji Ikeda +2 more | 2003-03-25 |
| 6512227 | Method and apparatus for inspecting patterns of a semiconductor device with an electron beam | Yuko Iwabuchi, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami, Mikio Ichihashi +6 more | 2003-01-28 |
| 6512228 | Scanning electron microscope | Sho Takami, Makoto Ezumi | 2003-01-28 |