Issued Patents 2003
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6667476 | Scanning electron microscope | Hideo Todokoro, Shou Takami, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2003-12-23 |
| 6653633 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2003-11-25 |
| 6646262 | Scanning electron microscope | Hideo Todokoro, Yoichi Ose, Naomasa Suzuki | 2003-11-11 |
| 6635873 | Scanning electron microscope with voltage applied to the sample | Hideo Todokoro, Yasutsugu Usami | 2003-10-21 |
| 6538249 | Image-formation apparatus using charged particle beams under various focus conditions | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2003-03-25 |
| 6512228 | Scanning electron microscope | Hideo Todokoro, Sho Takami | 2003-01-28 |