Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6419844 | Method for fabricating calibration target for calibrating semiconductor wafer test systems | Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson | 2002-07-16 |
| 6420892 | Calibration target for calibrating semiconductor wafer test systems | Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson | 2002-07-16 |
| 6359456 | Probe card and test system for semiconductor wafers | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty | 2002-03-19 |