Issued Patents 2002
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6466047 | System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources | Jorge L. deVarona, Salman Akram | 2002-10-15 |
| 6433574 | Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources | Jorge L. deVarona, Salman Akram | 2002-08-13 |
| 6366112 | Probe card having on-board multiplex circuitry for expanding tester resources | Jorge L. deVarona, Salman Akram | 2002-04-02 |
| 6359456 | Probe card and test system for semiconductor wafers | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy | 2002-03-19 |
| 6356098 | Probe card, test method and test system for semiconductor wafers | Salman Akram, Warren M. Farnworth, David R. Hembree | 2002-03-12 |
| 6337577 | Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources | Jorge L. deVarona, Salman Akram | 2002-01-08 |