Issued Patents All Time
Showing 51–59 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7881558 | Scanning microscope | Kazuo Aoki, Kenji Obara | 2011-02-01 |
| 7869969 | Defect review apparatus and method of reviewing defects | Takehiro Hirai, Kenji Obara | 2011-01-11 |
| 7732765 | Scanning electron microscope | Kenji Obara | 2010-06-08 |
| 7638767 | Scanning electron microscope | Kenji Obara | 2009-12-29 |
| 7526143 | Imaging method | Kazuo Aoki, Kenji Obara | 2009-04-28 |
| 7307254 | Scanning electron microscope | Kazuo Aoki, Seiji Isogai, Masashi Sakamoto | 2007-12-11 |
| 7307253 | Scanning electron microscope | Seiji Isogai, Kazuo Aoki, Masashi Sakamoto | 2007-12-11 |
| 7233995 | Method and device for connecting networks | Yasubumi Chimura, Tsuneyuki Sakano | 2007-06-19 |
| 7075077 | Method of observing a specimen using a scanning electron microscope | Hirohito Okuda, Toshifumi Honda, Kazuo Aoki, Masashi Sakamoto | 2006-07-11 |