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Phase change memory using multiple phase change layers and multiple heat conductors |
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Huanhuan Liu |
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Tester and method for calibrating probe card and device under testing (DUT) |
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Shih-Hsiung Huang, Chun Chang, Shun-Ta Wu |
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Phase change memory using multiple phase change layers and multiple heat conductors |
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Jhih-Han Du, Yi-Wei Lien, Che-Kai Lin |
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Method to produce high electron mobility transistors with Boron implanted isolation |
Walter Tony Wohlmuth, Jhih-Han Du, Yao-Chung Hsieh, Shih-Hui Huang |
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Ming-Cheng Chiang |
2013-03-05 |
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2012-04-10 |
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2011-05-24 |
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Yu-Chung Chin, Chao-Hsing Huang, Kun-Chuan Lin |
2008-06-10 |
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Negative-differential-resistance heterojunction bipolar transistor with topee-shaped current-voltage characteristics |
Wen-Chau Liu, Shiou-Ying Cheng |
2002-10-01 |
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