John L. Cain — 13 Patents at Vlsi Technology

John L. Cain has been granted 13 US patents while listed as an inventor at Vlsi Technology. The first was granted in 1993 and the most recent in April 2001. John L. Cain ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list John L. Cain in Schertz, TX, US.

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6217902	Soft gelatin capsules containing particulate material	Keith Tanner, Gregory A. Schurig, Frank S. S. Morton, Brian R. Pansari, Rickey S. Shelley +1 more	2001-04-17
5624582	Optimization of dry etching through the control of helium backside pressure	—	1997-04-29	$3,128,000
5610105	Densification in an intermetal dielectric film	Landon B. Vines, Sigmund Koenigseder, Chang-Ou Lee, Felix Fujishiro	1997-03-11	$4,672,000
5503881	Method of processing a semiconductor wafer	Michael P. Relue, Michael E. Costabile, William P. Marsh	1996-04-02	$3,158,000
5439524	Plasma processing apparatus	Michael P. Relue, Michael E. Costabile, William P. Marsh	1995-08-08	$14,289,000
5434104	Method of using corrosion prohibiters in aluminum alloy films	Landon B. Vines, Sigmund Koenigseder, Chang-Ou Lee, Felix Fujishiro	1995-07-18	$4,661,000
5433238	Pumping system for evacuating reactor chambers	Stephen J. Cannizzaro, Jr., Miguel A. Delgado, Ramiro Solis	1995-07-18	$4,661,000
5433823	Selective dry-etching of bi-layer passivation films	—	1995-07-18
5342476	Reduction of polycide residues through helium backside pressure control during dry etching	—	1994-08-30	$1,499,000
5336366	New dry etch technique	Chang-Ou Lee	1994-08-09	$4,111,000
5329161	Molybdenum boride barrier layers between aluminum and silicon at contact points in semiconductor devices	Landon B. Vines, Chang-Ou Lee, Sigmund Koenigseder, Felix Fujishiro	1994-07-12	$4,102,000
5286518	Integrated-circuit processing with progressive intermetal-dielectric deposition	Felix Fujishiro, Chang-Ou Lee, Sigmund Koenigseder, Landon B. Vines	1994-02-15	$3,184,000
5242532	Dual mode plasma etching system and method of plasma endpoint detection	—	1993-09-07	$7,180,000

John L. Cain — 13 Patents

Issued Patents All Time

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