Issued Patents All Time
Showing 51–73 of 73 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8921226 | Method of forming semiconductor structure having contact plug | Ching-Wen Hung, En-Chiuan Liou, Chih-Sen Huang | 2014-12-30 |
| 8912074 | Method of forming shallow trench isolations | En-Chiuan Liou, Chia-Jui Liang, Jia-Rong Wu | 2014-12-16 |
| 8883621 | Semiconductor structure and method of fabricating MOS device | Chia-Jung Li | 2014-11-11 |
| 8860181 | Thin film resistor structure | Ming-Te Wei, Chen-Hua Tsai, Chien-Yang Chen, Chia-Jui Liang, Ming-Tsung Chen | 2014-10-14 |
| 8836129 | Plug structure | Ching-Wen Hung, Chih-Sen Huang | 2014-09-16 |
| 8823132 | Two-portion shallow-trench isolation | En-Chiuan Liou, Chia-Jui Liang, Jia-Rong Wu | 2014-09-02 |
| 8816409 | Metal-oxide semiconductor transistor | Ming-Te Wei, Wen-Chen Wu, Lung-En Kuo | 2014-08-26 |
| 8592322 | Method of fabricating openings | Feng-Yi Chang, Pei-Yu Chou, Jiunn-Hsiung Liao, Chih-Wen Feng, Ying-Chih Lin | 2013-11-26 |
| 8575034 | Fabricating method of semiconductor element | Ming-Te Wei, Ming-Tsung Chen | 2013-11-05 |
| 8569127 | Semiconductor device and method for fabricating the same | Chien-Yang Chen, Chen-Hua Tsai, Shih-Fang Hong, Ming-Te Wei | 2013-10-29 |
| 8546962 | Mark structure and method for measuring alignment accuracy between former layer and latter layer | Jun-Chi Huang, Ming-Te Wei | 2013-10-01 |
| 8461649 | Opening structure for semiconductor device | Chang-Chi Huang, Ming-Tsung Chen, Feng-Yi Chang, Pei-Yu Chou, Jiunn-Hsiung Liao +2 more | 2013-06-11 |
| 8236702 | Method of fabricating openings and contact holes | Feng-Yi Chang, Pei-Yu Chou, Jiunn-Hsiung Liao, Chih-Wen Feng, Ying-Chih Lin | 2012-08-07 |
| 8164141 | Opening structure with sidewall of an opening covered with a dielectric thin film | Chang-Chi Huang, Ming-Tsung Chen, Feng-Yi Chang, Pei-Yu Chou, Jiunn-Hsiung Liao +2 more | 2012-04-24 |
| 8129235 | Method of fabricating two-step self-aligned contact | Ling-Chun Chou, Ming-Tsung Chen | 2012-03-06 |
| 7825034 | Method of fabricating openings and contact holes | Chang-Chi Huang, Ming-Tsung Chen | 2010-11-02 |
| 7817265 | Alignment mark and defect inspection method | Ling-Chun Chou, Ming-Tsung Chen, Hsi-Hua Liu, Shuen-Cheng Lei | 2010-10-19 |
| 7759742 | Metal oxide semiconductor transistor | Ming-Tsung Chen, Chang-Chi Huang | 2010-07-20 |
| 7595234 | Fabricating method for a metal oxide semiconductor transistor | Chang-Chi Huang, Ming-Tsung Chen, Yi-Yiing Chiang, Yu-Lan Chang, Chung-Ju Lee +2 more | 2009-09-29 |
| 7572722 | Method of fabricating nickel silicide | Yi-Wei Chen, Chao-Ching Hsieh, Yi-Yiing Chiang, Tzung-Yu Hung, Yu-Lan Chang +2 more | 2009-08-11 |
| 7384853 | Method of performing salicide processes on MOS transistors | Ming-Tsung Chen, Chang-Chi Huang | 2008-06-10 |
| 7385294 | Semiconductor device having nickel silicide and method of fabricating nickel silicide | Yi-Wei Chen, Chao-Ching Hsieh, Yi-Yiing Chiang, Tzung-Yu Hung, Yu-Lan Chang +2 more | 2008-06-10 |
| 7214988 | Metal oxide semiconductor transistor | Chang-Chi Huang, Ming-Tsung Chen, Yi-Yiing Chiang, Yu-Lan Chang, Chung-Ju Lee +2 more | 2007-05-08 |