Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8516400 | Method for predicting tolerable spacing between conductors in semiconductor process | Chien-Li Kuo, Wen-Jung Liao, Jiun-Hau Liao, Min-Chin Hsieh, Chun-Liang Hou | 2013-08-20 |
| 8487644 | Method and pattern carrier for optimizing inspection recipe of defect inspection tool | Pong-Wey Huang, Hsi-Hua Liu, Chia-Jen Wang, Huai Huang, Jen-Po Huang | 2013-07-16 |
| 7817265 | Alignment mark and defect inspection method | Ling-Chun Chou, Ming-Tsung Chen, Hsi-Hua Liu, Po-Chao Tsao | 2010-10-19 |