Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8487644 | Method and pattern carrier for optimizing inspection recipe of defect inspection tool | Pong-Wey Huang, Chia-Jen Wang, Shuen-Cheng Lei, Huai Huang, Jen-Po Huang | 2013-07-16 |
| 7817265 | Alignment mark and defect inspection method | Ling-Chun Chou, Ming-Tsung Chen, Shuen-Cheng Lei, Po-Chao Tsao | 2010-10-19 |