Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7217980 | CMOS silicon-control-rectifier (SCR) structure for electrostatic discharge (ESD) protection | Shiao-Shien Chen, Tien-Hao Tang | 2007-05-15 |
| 6878581 | Electrostatic discharge protection structure and a method for forming the same | Yuan-Chang Liu, Tien-Hao Tang | 2005-04-12 |
| 6873505 | Electrostatic discharge protective circuitry equipped with a common discharge line | Shiao-Shien Chen, Tien-Hao Tang | 2005-03-29 |
| 6583641 | Method of determining integrity of a gate dielectric | Shih-Chieh Kao, Yu-Yiu Lin | 2003-06-24 |
| 6483045 | Via plug layout structure for connecting different metallic layers | Shih-Chieh Kao, Shiang Huang-Lu, Yuan-Chang Liu | 2002-11-19 |
| 6455910 | Cross guard-ring structure to protect the chip crack in low dielectric constant and copper process | — | 2002-09-24 |
| 6448599 | Semiconductor device for preventing process-induced charging damages | — | 2002-09-10 |
| 6291281 | Method of fabricating protection structure | Tzung-Han Lee | 2001-09-18 |
| 6291285 | Method for protecting gate oxide layer and monitoring damage | Shiang Huang-Lu | 2001-09-18 |
| 6289291 | Statistical method of monitoring gate oxide layer yield | Kuan-Yu Fu | 2001-09-11 |
| 6274494 | Method of protecting gate oxide | Yih-Jau Chang | 2001-08-14 |
| 6269315 | Reliability testing method of dielectric thin film | Kuan-Yu Fu, Chuan Liu, Donald Cheng, Sheng-Hsing Yang | 2001-07-31 |
| 6245610 | Method of protecting a well at a floating stage | Tzung-Han Lee, Shiang Huang-Lu | 2001-06-12 |
| 6242763 | Low triggering voltage SOI silicon-control-rectifier (SCR) structure | Shiao-Shien Chen, Tien-Hao Tang, Jih-Wen Chou | 2001-06-05 |
| 6235642 | Method for reducing plasma charging damages | Tzung-Han Lee | 2001-05-22 |
| 6229347 | Circuit for evaluating an asysmetric antenna effect | Chau-Neng Wu, Shiang Huang-Lu | 2001-05-08 |
| 6191602 | Wafer acceptance testing method and structure of a test key used in the method | Shiang Huang-Lu, Kun-Cho Chen | 2001-02-20 |
| 6159864 | Method of preventing damages of gate oxides of a semiconductor wafer in a plasma-related process | Shih-Chung Li, Shih-Chieh Kao | 2000-12-12 |
| 6110841 | Method for avoiding plasma damage | Yih-Jau Chang | 2000-08-29 |
| 6060347 | Method for preventing damage to gate oxide from well in complementary metal-oxide semiconductor | — | 2000-05-09 |
| 6051986 | Method of testing a transistor | — | 2000-04-18 |
| 5959311 | Structure of an antenna effect monitor | Hsueh-Hao Shih, Juan-Yuan Wu, Water Lur | 1999-09-28 |