| 7217980 |
CMOS silicon-control-rectifier (SCR) structure for electrostatic discharge (ESD) protection |
Shiao-Shien Chen, Tien-Hao Tang |
2007-05-15 |
| 6878581 |
Electrostatic discharge protection structure and a method for forming the same |
Yuan-Chang Liu, Tien-Hao Tang |
2005-04-12 |
| 6873505 |
Electrostatic discharge protective circuitry equipped with a common discharge line |
Shiao-Shien Chen, Tien-Hao Tang |
2005-03-29 |
| 6583641 |
Method of determining integrity of a gate dielectric |
Shih-Chieh Kao, Yu-Yiu Lin |
2003-06-24 |
| 6483045 |
Via plug layout structure for connecting different metallic layers |
Shih-Chieh Kao, Shiang Huang-Lu, Yuan-Chang Liu |
2002-11-19 |
| 6455910 |
Cross guard-ring structure to protect the chip crack in low dielectric constant and copper process |
— |
2002-09-24 |
| 6448599 |
Semiconductor device for preventing process-induced charging damages |
— |
2002-09-10 |
| 6291281 |
Method of fabricating protection structure |
Tzung-Han Lee |
2001-09-18 |
| 6291285 |
Method for protecting gate oxide layer and monitoring damage |
Shiang Huang-Lu |
2001-09-18 |
| 6289291 |
Statistical method of monitoring gate oxide layer yield |
Kuan-Yu Fu |
2001-09-11 |
| 6274494 |
Method of protecting gate oxide |
Yih-Jau Chang |
2001-08-14 |
| 6269315 |
Reliability testing method of dielectric thin film |
Kuan-Yu Fu, Chuan Liu, Donald Cheng, Sheng-Hsing Yang |
2001-07-31 |
| 6245610 |
Method of protecting a well at a floating stage |
Tzung-Han Lee, Shiang Huang-Lu |
2001-06-12 |
| 6242763 |
Low triggering voltage SOI silicon-control-rectifier (SCR) structure |
Shiao-Shien Chen, Tien-Hao Tang, Jih-Wen Chou |
2001-06-05 |
| 6235642 |
Method for reducing plasma charging damages |
Tzung-Han Lee |
2001-05-22 |
| 6229347 |
Circuit for evaluating an asysmetric antenna effect |
Chau-Neng Wu, Shiang Huang-Lu |
2001-05-08 |
| 6191602 |
Wafer acceptance testing method and structure of a test key used in the method |
Shiang Huang-Lu, Kun-Cho Chen |
2001-02-20 |
| 6159864 |
Method of preventing damages of gate oxides of a semiconductor wafer in a plasma-related process |
Shih-Chung Li, Shih-Chieh Kao |
2000-12-12 |
| 6110841 |
Method for avoiding plasma damage |
Yih-Jau Chang |
2000-08-29 |
| 6060347 |
Method for preventing damage to gate oxide from well in complementary metal-oxide semiconductor |
— |
2000-05-09 |
| 6051986 |
Method of testing a transistor |
— |
2000-04-18 |
| 5959311 |
Structure of an antenna effect monitor |
Hsueh-Hao Shih, Juan-Yuan Wu, Water Lur |
1999-09-28 |