YL

Yu-Yiu Lin

UM United Microelectronics: 1 patents #2,686 of 4,560Top 60%
Overall (All Time): #3,515,398 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6583641 Method of determining integrity of a gate dielectric Mu-Chun Wang, Shih-Chieh Kao 2003-06-24