Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11391145 | Dynamic fracture width calculation method for drilling fluid loss in fractured formation | Chengyuan Xu, Xinglin YANG, Yili Kang, Lijun You, Yingrui Bai +2 more | 2022-07-19 |
| 11017134 | Quantitative scoring and optimization method of drilling and completion loss-control material | Chengyuan Xu, Yili Kang, Lijun You, Chao Jiang, Xiaopeng Yan +4 more | 2021-05-25 |
| 10782220 | Cross-scale wide-spectrum particle size plugging formula granularity analysis method | Cheng Xu, Jing Zhang, Yi Kang, Li You, Xiao Yan +3 more | 2020-09-22 |
| 9718802 | Crystal form of dabigatran etexilate mesylate and preparation method and use thereof | Liang Zhang, Jinyi Xu, Zhaozhao Zhang, Zhi Chen, Jian Chai +3 more | 2017-08-01 |
| 6653856 | Method of determining reliability of semiconductor products | — | 2003-11-25 |
| 6570388 | Transmission line pulse method for measuring electrostatic discharge voltages | Ming-Tsan Lee | 2003-05-27 |
| 6555485 | Method for fabricating a gate dielectric layer | Hsiu-Shan Lin, Yu-Yin Lin, Tung-Ming Pan, Kuo-Tai Huang | 2003-04-29 |
| 6268269 | Method for fabricating an oxide layer on silicon with carbon ions introduced at the silicon/oxide interface in order to reduce hot carrier effects | Ming-Tsan Lee, Kuan-Yu Fu | 2001-07-31 |
| 6269315 | Reliability testing method of dielectric thin film | Kuan-Yu Fu, Donald Cheng, Sheng-Hsing Yang, Mu-Chun Wang | 2001-07-31 |
| 6249139 | Lifetime measurement of an ultra-thin dielectric layer | Kuan-Yu Fu, Mainn-Gwo Chen | 2001-06-19 |
| 6072677 | Electrostatic discharge protective circuit formed by use of a silicon controlled rectifier | Mainn-Gwo Chen, Ming-Jer Chen | 2000-06-06 |