MY

Ming-Sheng Yang

UM United Microelectronics: 45 patents #69 of 4,560Top 2%
NA Nec Laboratories America: 10 patents #49 of 412Top 15%
IC Ipenval Consultant: 4 patents #1 of 8Top 15%
PG Personal Genomics: 2 patents #4 of 25Top 20%
NU National Chi Nan University: 2 patents #18 of 106Top 20%
Huawei: 1 patents #8,196 of 15,535Top 55%
LT Lite-On Technology: 1 patents #549 of 1,203Top 50%
VL Visera Technologies Company Limited: 1 patents #93 of 156Top 60%
VT Voltafield Technology: 1 patents #8 of 12Top 70%
CH Chimei: 1 patents #48 of 103Top 50%
📍 Tainan, CA: #7 of 115 inventorsTop 7%
Overall (All Time): #31,020 of 4,157,543Top 1%
68
Patents All Time

Issued Patents All Time

Showing 26–50 of 68 patents

Patent #TitleCo-InventorsDate
7037802 Chemical mechanical polishing in forming semiconductor device Juan-Yuan Wu, Water Lur 2006-05-02
6917109 Air gap structure and formation method for reducing undesired capacitive coupling between interconnects in an integrated circuit device Water Lur, David Lee, Kuang-Chih Wang 2005-07-12
6905938 Method of forming interconnect structure with low dielectric constant Chih-Chien Liu 2005-06-14
6858487 Method of manufacturing a semiconductor device Water Lur 2005-02-22
6790742 Chemical mechanical polishing in forming semiconductor device Juan-Yuan Wu, Water Lur 2004-09-14
6723609 Method of preventing leakage current of a metal-oxide semiconductor transistor Chia-Hung Kao, Chin-Cheng Chien 2004-04-20
6677231 Method for increasing adhesion ability of dielectric material in semiconductor Cheng-Yuan Tsai, Chin-Hsiang Lin 2004-01-13
6616510 Chemical mechanical polishing method for copper Chia-Lin Hsu, Teng-Chun Tsai, Yung-Tsung Wei 2003-09-09
6609954 Method of planarization Kuen-Jian Chen, Juan-Yuan Wu, Water Lur 2003-08-26
6596652 Method of fabricating low dielectric constant film Neng-Hui Yang 2003-07-22
6486079 Method for stabilizing low dielectric constant materials Cheng-Yuan Tsai, Yung-Tsung Wei, Teng-Chun Tsai 2002-11-26
6461230 Chemical-mechanical polishing method Teng-Chun Tsai, Hsueh-Chung Chen 2002-10-08
6455432 Method for removing carbon-rich particles adhered on a copper surface Teng-Chun Tsai, Chia-Lin Hsu, Yung-Tsung Wei 2002-09-24
6440861 Method of forming dual damascene structure Chih-Chien Liu, Jui-Tsen Huang, Yi-Fang Cheng 2002-08-27
6429152 Method of forming a thin film on a semiconductor wafer Neng-Hui Yang 2002-08-06
6429115 Method of manufacturing multilevel interconnects including performing a surface treatment to form a hydrophilic surface layer Cheng-Yuan Tsai, Chin-Hsiang Lin 2002-08-06
6410446 Method for gap filling Cheng-Yuan Tsai, Chih-Chien Liu 2002-06-25
6410106 Method of forming an intermetal dielectric layer Cheng-Yuan Tsai, Chih-Chien Liu 2002-06-25
6406978 Method of removing silicon carbide Neng-Hui Yang, Chien-Mei Wang 2002-06-18
6403469 Method of manufacturing dual damascene structure Teng-Chun Tsai, Hsueh-Chung Chen 2002-06-11
6387813 Method for stripping a low dielectric film with high carbon content Neng-Hui Yang, Chih-Chien Liu 2002-05-14
6383913 Method for improving surface wettability of low k material Cheng-Yuan Tsai 2002-05-07
6380069 Method of removing micro-scratch on metal layer Hsueh-Chung Chen, Yung-Tsung Wei 2002-04-30
6376394 Method of forming inter-metal dielectric layer Cheng-Yuan Tsai, Chih-Chien Liu 2002-04-23
6365527 Method for depositing silicon carbide in semiconductor devices Neng-Hui Yang 2002-04-02