MT

Meng-Jin Tsai

UM United Microelectronics: 26 patents #190 of 4,560Top 5%
UM United Microelectrics: 1 patents #2 of 9Top 25%
Overall (All Time): #147,371 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 25 most recent of 27 patents

Patent #TitleCo-InventorsDate
8389410 Chemical mechanical polishing method Kun-Lin Wu 2013-03-05
7947603 Chemical-mechanical polishing method Kun-Lin Wu 2011-05-24
7335598 Chemical-mechanical polishing method Kun-Lin Wu 2008-02-26
6913993 Chemical-mechanical polishing method Kun-Lin Wu 2005-07-05
6403487 Method of forming separated spacer structures in mixed-mode integrated circuits Cheng-Han Huang, Cheng-Jung Hsu, Po-Hung Chen 2002-06-11
6281694 Monitor method for testing probe pins 2001-08-28
6268266 Method for forming enhanced FOX region of low voltage device in high voltage process Ching-Chun Hwang, Fei Chen, Wei-Chung Chen 2001-07-31
6251748 Method of manufacturing shallow trench isolation structure 2001-06-26
6232197 Metal-insulator-metal capacitor 2001-05-15
6190983 Method for fabricating high-voltage device 2001-02-20
6156640 Damascene process with anti-reflection coating Yimin Huang 2000-12-05
6140156 Fabrication method of isolation structure photodiode 2000-10-31
6114220 Method of fabricating a shallow trench isolation 2000-09-05
6077784 Chemical-mechanical polishing method Kun-Lin Wu 2000-06-20
6037201 Method for manufacturing mixed-mode devices Cheng-Han Huang 2000-03-14
6001735 Dual damascene technique 1999-12-14
5981379 Method of forming via 1999-11-09
5981353 Method of forming a shallow trench isolation region 1999-11-09
5965464 Manufacturing method of double spacer structure for mixed-mode IC Cheng-Han Huang, Te-Chuan Liao, Chen-Wei Lee 1999-10-12
5937291 Method for forming poly-via connection between load transistor drain and driver transistor gate in SRAM Kun-Cho Chen 1999-08-10
5926729 Method for forming gate oxide layers of various predefined thicknesses Heng-Sheng Huang 1999-07-20
5920779 Differential gate oxide thickness by nitrogen implantation for mixed mode and embedded VLSI circuits Shih-Wei Sun 1999-07-06
5913132 Method of forming a shallow trench isolation region 1999-06-15
5861329 Method of fabricating metal-oxide semiconductor (MOS) transistors with reduced level of degradation caused by hot carriers Wen-Kuan Yeh, Coming Chen, Jih-Wen Chou 1999-01-19
5712185 Method for forming shallow trench isolation Water Lur, Chin-Lai Chen 1998-01-27