Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9343377 | Test then destroy technique for security-focused semiconductor integrated circuits | Andy Yang, Don Stark, Shahriar Rabii, Srenik Mehta | 2016-05-17 |
| 6363336 | Fine grain translation discrimination | John Banning, H. Peter Anvin, David Keppel, Alex Klaiber, Paul Serris | 2002-03-26 |