Issued Patents All Time
Showing 326–350 of 865 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9103885 | Integrated circuit with plural comparators receiving expected data and mask data from different pads | Alan Hales | 2015-08-11 |
| 9103882 | Automatable scan partitioning for low power using external control | Jayashree Saxena | 2015-08-11 |
| 9103881 | Operating scan path generators and compactors sequentially and capturing simultaneously | — | 2015-08-11 |
| 9097763 | State machine shifting between idle, capture, shift 1, shift 2 | — | 2015-08-04 |
| 9091728 | Scan test controller with state machine and gates | — | 2015-07-28 |
| 9081064 | IC scan cell coupled to TSV top and bottom contacts | — | 2015-07-14 |
| 9081059 | Formatter selectively routing response data to stimulus data inputs | — | 2015-07-14 |
| 9075113 | Linking module with IC and core TAP output enable leads | Baher Haroun, Brian J. Lasher, Anjali Vij | 2015-07-07 |
| 9052362 | Scan test port capture/shift signals maintaining/transitioning sequence and idle states | — | 2015-06-09 |
| 9052361 | Wired-or fail flag in serial stimulus, expected/mask data test circuitry | — | 2015-06-09 |
| 9046575 | TAP test clock control circuitry connected to device address port | — | 2015-06-02 |
| 9046571 | Tap with test compression architecture and start bit detector circuit | — | 2015-06-02 |
| 9043664 | I/O linking, TAP selection and multiplexer remove select control circuitry | — | 2015-05-26 |
| 9037932 | Position independent testing of circuits | — | 2015-05-19 |
| 9021322 | Probeless testing of pad buffers on wafer | — | 2015-04-28 |
| 9015544 | Accelerating scan test by re-using response data as stimulus data abstract | — | 2015-04-21 |
| 9003250 | Compressor inputs from scan register output and input through flip-flop | — | 2015-04-07 |
| 9003249 | IC test circuitry with tri-state buffer, comparator, and scan cell | — | 2015-04-07 |
| 8990650 | TCA with scan paths, decompressor, compressor, and output shift register | — | 2015-03-24 |
| 8990649 | Access port selector for access port and compliant access port | — | 2015-03-24 |
| 8984359 | Base, IC, and coupling interposer with boundary scan register | — | 2015-03-17 |
| 8984358 | IC TAP with address, state monitor, and state decode circuitry | — | 2015-03-17 |
| 8984357 | Wrapper selector data register having control outputs and SELECTAM input | — | 2015-03-17 |
| 8984356 | Circuitry selectively coupling scan circuitry to test data out lead | — | 2015-03-17 |
| 8977920 | DDR circuitry data and control buses connected to test circuitry | — | 2015-03-10 |