LW

Lee D. Whetsel

TI Texas Instruments: 863 patents #1 of 12,488Top 1%
📍 Parker, TX: #1 of 75 inventorsTop 2%
🗺 Texas: #1 of 125,132 inventorsTop 1%
Overall (All Time): #87 of 4,157,543Top 1%
865
Patents All Time

Issued Patents All Time

Showing 351–375 of 865 patents

Patent #TitleCo-InventorsDate
8977919 Scan, test, and control circuits coupled to IC surfaces contacts 2015-03-10
8977918 IC with connections between linking module and test access ports Baher Haroun 2015-03-10
8972810 I/O circuitry free of test clock coupled with destination/source circuitry 2015-03-03
8972809 Test messaging and control circuitry coupled to power pad 2015-03-03
8964918 IC first, second communication circuits each with three communication states 2015-02-24
8959396 Commandable data register control router connected to TCK and TDI 2015-02-17
8943376 Position independent testing of circuits 2015-01-27
8941400 Parallel scan paths with three bond pads, distributors and collectors 2015-01-27
8941109 Test output buffer functional output input, test output, enable input Richard L. Antley 2015-01-27
8938652 Addressable tap domain selection circuit with AUXI/O, TDI/TDO, TMS/TRCK leads 2015-01-20
8935585 Tap controller having TMS, TCK, enable inputs and control outputs 2015-01-13
8924802 IC TAP with dual port router and additional capture input 2014-12-30
8924804 Synchronizer and buffers delaying strobe to individual parallel scan paths 2014-12-30
8918687 IC clock doubler output gated to multiplexer and output buffer 2014-12-23
8918688 Gating WSP capture and TAP ShiftDR with TAP IR enable 2014-12-23
8910003 Controller circuitry with state machines, address store/compare, and shift register 2014-12-09
8898528 DDR JTAG interface setting flip-flops in high state at power-up 2014-11-25
8892970 Address and instruction controller with TCK, TMS, address match inputs 2014-11-18
8880966 Transitioning POLL IN to set MRST and CE high states 2014-11-04
8880967 Semiconductor test system and method 2014-11-04
8880968 Interposer having functional leads, TAP, trigger unit, and monitor circuitry 2014-11-04
8872178 IC with comparator receiving expected and mask data from pads Alan Hales 2014-10-28
8850279 IC test linking module with augmentation instruction shift register Baher Haroun 2014-09-30
8839060 JTAG shadow protocol circuit with detection, command and address circuits 2014-09-16
8839059 Core circuit test architecture 2014-09-16