Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9875892 | Method of forming a photoresist layer | Chun-Wei Chang, Chih-Chien Wang, Hung-Chang Hsieh | 2018-01-23 |
| 9791775 | Lithography process on high topology features | Chun-Wei Chang, Hong-Da Lin, Chih-Chien Wang, Chun-Chang Chen, Hung-Chang Hsieh | 2017-10-17 |
| 9651869 | Film portion at wafer edge | Chun-Wei Chang, Hung-Chang Hsieh | 2017-05-16 |
| 9372406 | Film portion at wafer edge | Chun-Wei Chang, Hung-Chang Hsieh | 2016-06-21 |
| 9360755 | Thickening phase for spin coating process | Chun-Wei Chang, Chia-Chieh Lin, Chih-Chien Wang, Hung-Chang Hsieh | 2016-06-07 |
| 9349662 | Test structure placement on a semiconductor wafer | Chuan-Ling Wu, Cheng-Hsien Chuang, Chun-Chang Chen, Hung-Chang Hsieh | 2016-05-24 |
| 9285677 | Lithography process on high topology features | Chun-Wei Chang, Hong-Da Lin, Chih-Chien Wang, Chun-Chang Chen, Hung-Chang Hsieh | 2016-03-15 |
| 9153620 | Method of fabricating a metal grid for semiconductor device | Chih-Chien Wang, Chihy-Yuan Cheng, Chuan-Ling Wu, Chun-Chang Chen, Feng-Jia Shiu | 2015-10-06 |
| 9028915 | Method of forming a photoresist layer | Chun-Wei Chang, Chih-Chien Wang, Hung-Chang Hsieh | 2015-05-12 |
| 8940574 | Metal grid in backside illumination image sensor chips and methods for forming the same | Chih-Chien Wang, Chu-Wei Chang, Hung-Chang Hsieh | 2015-01-27 |
| 8883403 | Method of semiconductor integrated circuit fabrication | Chun-Chang Chen, Shun-Shing Yang, Chuan-Ling Wu, Hung-Chang Hsieh | 2014-11-11 |
| 8771534 | Manufacturing techniques for workpieces with varying topographies | Chun-Chang Chen, Shih-Chi Fu, Hung-Chang Hsieh | 2014-07-08 |
| 8759225 | Method to form a CMOS image sensor | Chung Chien Wang, Yeur-Luen Tu, Cheng-Ta Wu, Jiech-Fun Lu, Chun-Wei Chang +2 more | 2014-06-24 |
| 8692296 | Semiconductor devices and manufacturing methods thereof | Chun-Chang Chen, Shun-Shing Yang, Shih-Chi Fu, Hung-Chang Hsieh | 2014-04-08 |
| 8623229 | Manufacturing techniques to limit damage on workpiece with varying topographies | Chun-Chang Chen, Shih-Chi Fu, Hung-Chang Hsieh | 2014-01-07 |