Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11069419 | Test line letter for embedded non-volatile memory technology | Jui-Tsung Lien, Fang-Lan Chu, Wei-Cheng Wu, Ku-Ning Chang, Yu-Chen Wang | 2021-07-20 |
| 10163522 | Test line letter for embedded non-volatile memory technology | Jui-Tsung Lien, Fang-Lan Chu, Wei-Cheng Wu, Ku-Ning Chang, Yu-Chen Wang | 2018-12-25 |
| 9983257 | Test line patterns in split-gate flash technology | Wei-Cheng Wu, Jui-Tsung Lien, Fang-Lan Chu, Ku-Ning Chang, Yu-Chen Wang | 2018-05-29 |
| 9791775 | Lithography process on high topology features | Chun-Wei Chang, Chih-Chien Wang, Chun-Chang Chen, Wang-Pen Mo, Hung-Chang Hsieh | 2017-10-17 |
| 9285677 | Lithography process on high topology features | Chun-Wei Chang, Chih-Chien Wang, Chun-Chang Chen, Wang-Pen Mo, Hung-Chang Hsieh | 2016-03-15 |