Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9671685 | Lithographic plane check for mask processing | Chin-Hsiang Lin, Heng-Jen Lee, I-Hsiung Huang, Chih-Chiang Tu, Chun-Jen Chen | 2017-06-06 |
| 8818072 | Rendered database image-to-inspection image optimization for inspection | Biow Hiem Ong, Chih-Chiang Tu, Chia-Shih Lin, Jong-Yuh Chang | 2014-08-26 |
| 8592102 | Cost-effective method for extreme ultraviolet (EUV) mask production | Chin-Hsiang Lin, Heng-Jen Lee, I-Hsiung Huang, Chih-Chiang Tu, Chun-Jen Chen | 2013-11-26 |