Issued Patents All Time
Showing 1–25 of 98 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10629735 | Reacted conductive gate electrodes and methods of making the same | Richard Hammond | 2020-04-21 |
| 10510581 | Methods of forming strained-semiconductor-on-insulator device structures | Thomas A. Langdo, Richard Hammond, Anthony J. Lochtefeld, Eugene A. Fitzgerald | 2019-12-17 |
| 10164015 | Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same | Anthony J. Lochtefeld, Richard Hammond, Eugene A. Fitzgerald | 2018-12-25 |
| 10050145 | Methods for forming semiconductor device structures | Anthony J. Lochtefeld, Thomas A. Langdo, Richard Hammond, Eugene A. Fitzgerald | 2018-08-14 |
| 9934964 | Semiconductor heterostructures having reduced dislocation pile-ups and related methods | Christopher Leitz, Christopher Vineis, Richard Westhoff, Vicky Yang | 2018-04-03 |
| 9923057 | Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same | Anthony J. Lochtefeld, Richard Hammond, Eugene A. Fitzgerald | 2018-03-20 |
| 9812572 | Reacted conductive gate electrodes and methods of making the same | Richard Hammond | 2017-11-07 |
| 9601623 | Methods for forming semiconductor device structures | Anthony J. Lochtefeld, Thomas A. Langdo, Richard Hammond, Eugene A. Fitzgerald | 2017-03-21 |
| 9548236 | Methods of forming strained-semiconductor-on-insulator device structures | Thomas A. Langdo, Richard Hammond, Anthony J. Lochtefeld, Eugene A. Fitzgerald | 2017-01-17 |
| 9508724 | Strained channel dynamic random access memory devices | Mayank Bulsara, Anthony J. Lochtefeld | 2016-11-29 |
| 9431243 | Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication | Anthony J. Lochtefeld, Zhiyuan Cheng, James Fiorenza, Glyn Braithwaite, Thomas A. Langdo | 2016-08-30 |
| 9343539 | Reacted conductive gate electrodes and methods of making the same | Richard Hammond | 2016-05-17 |
| 9309607 | Semiconductor heterostructures having reduced dislocation pile-ups and related methods | Christopher Leitz, Christopher Vineis, Richard Westhoff, Vicky Yang | 2016-04-12 |
| 9293582 | Hybrid fin field-effect transistor structures and related methods | — | 2016-03-22 |
| 9281376 | Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same | Anthony J. Lochtefeld, Richard Hammond, Eugene A. Fitzgerald | 2016-03-08 |
| 9219112 | Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication | Anthony J. Lochtefeld, Zhiyuan Cheng, James Fiorenza, Glyn Braithwaite, Thomas A. Langdo | 2015-12-22 |
| 9153591 | Strained channel dynamic random access memory devices | Mayank Bulsara, Anthony J. Lochtefeld | 2015-10-06 |
| 9064930 | Methods for forming semiconductor device structures | Thomas A. Langdo, Anthony J. Lochtefeld, Richard Hammond, Eugene A. Fitzgerald | 2015-06-23 |
| 9048167 | Reacted conductive gate electrodes and methods of making the same | Richard Hammond | 2015-06-02 |
| 9018055 | Hybrid fin field-effect transistor structures and related methods | — | 2015-04-28 |
| 8987028 | Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication | Anthony J. Lochtefeld, Zhiyuan Cheng, James Fiorenza, Glyn Braithwaite, Thomas A. Langdo | 2015-03-24 |
| 8890226 | Strained channel dynamic random access memory devices | Mayank Bulsara, Anthony J. Lochtefeld | 2014-11-18 |
| 8823056 | Semiconductor heterostructures having reduced dislocation pile-ups and related methods | Christopher Leitz, Christopher Vineis, Richard Westhoff, Vicky Yang | 2014-09-02 |
| 8809835 | RF circuits including transistors having strained material layers | Glyn Braithwaite, Richard Hammond | 2014-08-19 |
| 8796734 | Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication | Anthony J. Lochtefeld, Zhiyuan Cheng, James Fiorenza, Glyn Braithwaite, Thomas A. Langdo | 2014-08-05 |