GB

Glyn Braithwaite

TSMC: 11 patents #2,595 of 12,232Top 25%
AS Amberwave Systems: 4 patents #11 of 20Top 60%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
📍 Dresden, NH: #1 of 1 inventorsTop 100%
Overall (All Time): #298,396 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
9431243 Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication Anthony J. Lochtefeld, Matthew T. Currie, Zhiyuan Cheng, James Fiorenza, Thomas A. Langdo 2016-08-30
9219112 Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication Anthony J. Lochtefeld, Matthew T. Currie, Zhiyuan Cheng, James Fiorenza, Thomas A. Langdo 2015-12-22
8987028 Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication Anthony J. Lochtefeld, Matthew T. Currie, Zhiyuan Cheng, James Fiorenza, Thomas A. Langdo 2015-03-24
8809835 RF circuits including transistors having strained material layers Richard Hammond, Matthew T. Currie 2014-08-19
8796734 Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication Anthony J. Lochtefeld, Matthew T. Currie, Zhiyuan Cheng, James Fiorenza, Thomas A. Langdo 2014-08-05
8704229 Partial poly amorphization for channeling prevention Peter Javorka 2014-04-22
8629477 Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication Anthony J. Lochtefeld, Matthew T. Currie, Zhiyuan Cheng, James Fiorenza, Thomas A. Langdo 2014-01-14
8519436 Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication Anthony J. Lochtefeld, Matthew T. Currie, Zhiyuan Cheng, James Fiorenza, Thomas A. Langdo 2013-08-27
8324660 Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication Anthony J. Lochtefeld, Matthew T. Currie, Zhiyuan Cheng, James Fiorenza, Thomas A. Langdo 2012-12-04
8247798 RF circuits including transistors having strained material layers Richard Hammond, Matthew T. Currie 2012-08-21
7906776 RF circuits including transistors having strained material layers Richard Hammond, Matthew T. Currie 2011-03-15
7709828 RF circuits including transistors having strained material layers Richard Hammond, Matthew T. Currie 2010-05-04
7109516 Strained-semiconductor-on-insulator finFET device structures Thomas A. Langdo, Matthew T. Currie, Richard Hammond, Anthony J. Lochtefeld, Eugene A. Fitzgerald 2006-09-19
7074623 Methods of forming strained-semiconductor-on-insulator finFET device structures Anthony J. Lochtefeld, Thomas A. Langdo, Richard Hammond, Matthew T. Currie, Eugene A. Fitzgerald 2006-07-11
6933518 RF circuits including transistors having strained material layers Richard Hammond, Matthew T. Currie 2005-08-23
6680496 Back-biasing to populate strained layer quantum wells Richard Hammond 2004-01-20