LC

Li-Chih Chen

TSMC: 9 patents #2,978 of 12,232Top 25%
WI Wistron: 1 patents #959 of 2,107Top 50%
Overall (All Time): #514,902 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
9205588 Temperature measurement component embedded hot runner nozzle structure Yuan-Shiang Lin, An-Chen Hung, Chien-Yu Ko 2015-12-08
8497584 Method to improve bump reliability for flip chip device Yen-Ming Chen, Chia-Fu Lin, Shun-Liang Hsu, Kai-Ming Ching, Hsin-Hui Lee +1 more 2013-07-30
7906425 Fluxless bumping process Chao-Yuan Su, Chia-Fu Lin, Hsin-Hui Lee, Yen-Ming Chen, Kai-Ming Ching +2 more 2011-03-15
7276454 Application of impressed-current cathodic protection to prevent metal corrosion and oxidation Kai-Ming Ching, Chia-Fu Lin, Wen-Hsiang Tseng, Ta-Min Lin, Yen-Ming Chen +2 more 2007-10-02
7134199 Fluxless bumping process Chao-Yuan Su, Chia-Fu Lin, Hsin-Hui Lee, Yen-Ming Chen, Kai-Ming Ching +2 more 2006-11-14
6974659 Method of forming a solder ball using a thermally stable resinous protective layer Chao-Yuan Su, Chia-Fu Lin, Hsin-Hui Lee, Yen-Ming Chen, Kai-Ming Ching 2005-12-13
6802250 Stencil design for solder paste printing Chao-Yuan Su, Chia-Fu Lin, Hsin-Hui Lee, Yen-Ming Chen, Kai-Ming Ching 2004-10-12
6756294 Method for improving bump reliability for flip chip devices Yen-Ming Chen, Chia-Fu Lin, Shun-Liang Hsu, Kai-Ming Ching, Hsin-Hui Lee +1 more 2004-06-29
6743660 Method of making a wafer level chip scale package Hsin-Hui Lee, Chia-Fu Lin, Chao-Yuan Su, Yen-Ming Chen, Kai-Ming Ching 2004-06-01
6636313 Method of measuring photoresist and bump misalignment Yen-Ming Chen, Chia-Fu Lin, Kai-Ming Ching, Chao-Yuan Su, Hsin-Hui Lee 2003-10-21