CL

Chung-Ju Lee

TSMC: 235 patents #53 of 12,232Top 1%
QT Quester Technology: 9 patents #2 of 16Top 15%
UM United Microelectronics: 4 patents #1,253 of 4,560Top 30%
VS Vanguard International Semiconductor: 4 patents #151 of 585Top 30%
MT Microelectronic & Computer Technology: 3 patents #33 of 112Top 30%
Lam Research: 2 patents #1,015 of 2,128Top 50%
PF Parabellum Strategic Opportunities Fund: 1 patents #3 of 25Top 15%
Canon: 1 patents #14,899 of 19,416Top 80%
📍 Hsinchu, TX: #1 of 47 inventorsTop 3%
Overall (All Time): #1,811 of 4,157,543Top 1%
260
Patents All Time

Issued Patents All Time

Showing 251–260 of 260 patents

Patent #TitleCo-InventorsDate
6143664 Method of planarizing a structure having an interpoly layer Liang-Gi Yao, Yue Chen, Wei-Ray Lin, Yeur-Luen Tu 2000-11-07
6140456 Chemicals and processes for making fluorinated poly(para-xylylenes) Hui Wang, Giovanni Antonio Foggiato 2000-10-31
6114227 Chamber for reducing contamination during chemical vapor deposition David Leksell, Ming Xi Chan, Joseph P. Ellul, Jeanne Luce, David Thomas Ryan +3 more 2000-09-05
6086679 Deposition systems and processes for transport polymerization and chemical vapor deposition Hui Wang, Giovanni Antonio Foggiato 2000-07-11
6079353 Chamber for reducing contamination during chemical vapor deposition David Leksell, Ming Xi Chan, Joseph P. Ellul, Jeanne Luce, David Thomas Ryan +2 more 2000-06-27
6051321 Low dielectric constant materials and method Hui Wang, Giovanni Antonio Foggiato 2000-04-18
6020458 Precursors for making low dielectric constant materials with improved thermal stability Hui Wang, Giovanni Antonio Foggiato 2000-02-01
5508228 Compliant electrically connective bumps for an adhesive flip chip integrated circuit device and methods for forming same Ernest R. Nolan, Diana C. Duane, Todd H. Herder, Thomas Alan Bishop, Kimcuc T. Tran +5 more 1996-04-16
5358604 Method for producing conductive patterns Charles W. C. Lin, Tom J. Hirsch, Kimcuc T. Tran 1994-10-25
5192581 Protective layer for preventing electroless deposition on a dielectric Tom J. Hirsch, Charles W. C. Lin, Heinrich Muller 1993-03-09